Cascade
eVue Microscope
Digital imaging system
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Experience the future of digital imaging
The eVue V is the latest edition of FormFactor’s leading-edge digital imaging system. Equipped with new sensor technology and high-resolution optics, it is the perfect choice for ultra-precise on-wafer measurements, offering unsurpassed automation features that provide increased throughput and the highest productivity.
The eVue V is available for FormFactor’s automated and manual probe stations, seamlessly integrating with the Velox probe station control software. It is ideal for challenging applications, including IV/CV, small pad probing, ultra-low noise, RF/mmW, load-pull, high power, and silicon photonics.
The system features a large 20MP sensor and a range of high-quality optics, ensuring maximum optical resolution. Optimized with FormFactor’s unique Megapixel Mode, the eVue V delivers ultra-sharp image quality and video speed of up to 20 fps.
The slim design of the eVue V allows for seamless integration of frequency extenders and tuners, ensuring the shortest distance to the Device Under Test (DUT). This design significantly reduces insertion loss and maximizes accuracy for S-parameters and load-pull applications.
The eVue V incorporates FormFactor’s patent-pending crash detection technology, safeguarding valuable equipment from costly damage, even in the event of probe contact. If accidental contact occurs with the test equipment or probes, the microscope instantly halts all movements and retracts the objective lens. Additionally, users can define software fences in the Velox probe station control software, setting limits on microscope movement.
Objective lens exchange becomes easy and quick with the Intelligent Objective Lens Mount, which automatically detects the lens and retrieves associated calibration data. This feature enables faster time to measurement without the need for re-calibration.
As an integral part of FormFactor’s patented Autonomous RF and Autonomous DC Measurement Assistants, the eVue V enables real unattended use with accurate automated probe-to-pad alignment across a wide temperature range. It also includes continuous calibration monitoring and re-calibration, as well as automated probe cleaning.
Maximized Field-of-View with Ultra-Sharp Image Quality
The eVue V features a large 20MP sensor and a range of high-quality optics, providing maximum optical resolution. The system is optimized with FormFactor’s unique Megapixel Mode, enabling ultra-sharp image quality and video speed of up to 20 fps.
Slim Design
The slim design of the eVue V allows for seamless integration of frequency extenders and tuners, ensuring the shortest distance to the Device Under Test (DUT). This design significantly reduces insertion loss and maximizes accuracy for S-parameters and load-pull applications.
Patent-Pending Crash Protection
The eVue V comes with FormFactor’s patent-pending crash detection, which protects valuable equipment from expensive damage, even when probes are in contact. If accidental contact with the test equipment or probes occurs, the microscope will immediately halt all movements and retract the objective lens. Furthermore, the Velox probe station control software allows the definition of additional software fences, which restrict the range of microscope movement according to specified limits.
Intelligent Lens Mount
Objective lens exchange becomes easy and quick with the Intelligent Objective Lens Mount, which automatically detects the lens and retrieves associated calibration data. This feature enables faster time to measurement without the need for re-calibration.
Application Flexibility
The eVue V is a versatile system suitable for a wide range of applications, including IV/CV, small pad probing, RF/mmW, load-pull, high power, and silicon photonics. It is certified for high-voltage measurements and has been thoroughly tested to ensure accurate and reliable ultra-low noise measurements.
Seamless Integration with Velox Probe Station Control Software
The eVue V, combined with Velox software, offers up to eight detailed views for a thorough wafer examination. The Find Focus feature ensures clear images on uneven surfaces, while the CellView function enables easy navigation and analysis of previously unseen areas.
Autonomous Measurement Assistants
As an integral part of FormFactor’s patented Autonomous RF and Autonomous DC Measurement Assistants, the eVue V enables real unattended use with accurate automated probe-to-pad alignment across a wide temperature range. It also includes continuous calibration monitoring and re-calibration, as well as automated probe cleaning.
Remote Operation
The eVue V offers the convenience of remote operation, allowing users to access and control it from home or anywhere in the world via the Velox Probe Station Control Software.
eVue IV Microscope
The eVue IV digital imaging system combines extraordinary optical performance with increased productivity.
SourceOne – Certified Pre-Owned Equipment
You want the best price-performance ratio for your wafer probe station? With our Certified Used Equipment we have an attractive option for you.
SourceOne – Factory Refurbishment Program
Extend the use of your probe station for up to another 15 years with our Factory Refurbishment Program.
SourceOne – Trade In / Buy Back Program
We'll take your probe station back for a credit note.
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