Applications
From the engineering lab to the production test floor, FormFactor’s products enable a wide range of test and measurement applications.
Research and Development
Find out how FormFactor products and expertise are used by engineers in R&D labs to study and optimize new devices and technologies.
High Volume Production
Learn how FormFactor products enable the test of virtually all types of chips manufactured today in the high-volume production environment.
Partner Solutions
FormFactor partners with other test and measurement leaders to deliver integrated, powerful, and optimized solutions to address essential and emerging applications.
Resources
Explore additional resources including technical papers, case studies, videos and other downloads.
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DC Parametric Test
Accurate and repeatable DC parametric measurements (IV, CV, pulsed, and high-power) help reduce uncertainty.
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Low Frequency Noise
Low frequency noise is a key limiter of electronic device and circuit performance -- accurately measuring low frequency noise (LFN) at wafer level is critical.
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Power Semiconductors
Next generation power devices are rapidly being developed to bring down end-user device costs and support a wide range of applications. We safely enable the test of these devices.
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RF/mmW and 5G
In both engineering characterization and production, the challenge of testing 5G and other RF devices is how to test a broad spectrum of frequencies while maintaining high throughput.
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Terahertz
Research into new materials and semiconductor technology is pushing existing test frequency boundaries to terahertz (THz) extremes.
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mm-Wave Load-Pull
Load pull tuners optimize the power or efficiency of RF devices. We help to measure the performance characteristics of the device under test
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Silicon Photonics
Silicon photonics merges two technologies—integrated circuits and optical communications for spectacular gains in speed, power efficiency and density. FormFactor plays a significant role in the implementation of silicon photonics technology.
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VCSELs and MicroLEDs
Optical technologies such as VCSELs and MicroLEDs are enabling new possibilities for smarter, safer, more secure technologies. We enable the challenging tests of these light emitting devices.
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Quantum Computing
Quantum computers promise to deliver dramatic breakthroughs in many scientific and engineering fields. We help to characterize and test these processing devices at temperatures approaching absolute zero.
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Cryogenic Devices
FormFactor helps bring devices that require cryogenic temperatures to market, using high-performance cryogenic probe systems with unmatched automation capabilities.
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Logic and System-on-a-Chip (SoC)
The decision-making built into modern electronics is powered by a variety of processing devices, from CPUs and GPUs to microcontrollers and more. Learn how FormFactor enables the verification of these chips and lowers the cost of test on the production test floor.
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DRAM and Flash Memory
Increased data consumption and the growing proliferation of smartphones are driving the demand for DRAM and Flash memory. FormFactor helps manufacturers to speed the verification and lower the cost of testing these devices with high parallelism wafer test solutions.
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Advanced Packaging
As companies employ advanced packaging techniques, they need cost effective test solutions to move to high volume production. FormFactor is the only test and measurement company that can help customers verify device performance and yield at every stage of system integration.
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RF/mmW and 5G
FormFactor is the leader in providing wafer test solutions to the RF industry for communication IC validation. In production, the challenge of testing 5G and other RF devices is how to test a broad spectrum of frequencies while maintaining high throughput.
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AI Processors
AI requires high volume computing power to continually model the behavior of each node during each training cycle. FormFactor technologies overcome the unique thermal challenges of these large, hot devices.
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Optical Test
FormFactor’s family of optical device probe cards offer customized solutions for testing CMOS image sensors and LED devices.
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Parametric Test
During the manufacturing process, device developers can test structures such as transistors with electrical contact. These structures can be on the metal layer within the die or, in some cases, within the scribe lines. FormFactor parametric solution help manufacturers characterize their performance on wafer.
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Cryogenic Testing
Our high-performance cryogenic probe stations for on-wafer and multi-chip measurements support a wide range of challenging applications, including strategies for enabling quantum test from 77K down to milli-Kelvin.
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Partner Solutions - MeasureOne
MeasureOne is a unique commitment between FormFactor and a select group of industry-leading test and measurement partners to deliver comprehensive, optimized solutions and applications expertise.
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1/f Device Characterization
On-wafer noise measurements such as flicker noise, RTN, and phase noise are increasingly important for advanced nodes and high-frequency technologies.
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Circuit Characterization
On-wafer measurements of circuits such as amplifiers, mixers and filters can be challenging, especially when a single wafer can include multiple circuit types.
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Cryogenic / Magnetic Probing
Advances in the physical sciences are leveraging superconductivity, magnetism, and quantum behaviors in new ways to provide unmatched processing power, reduce energy use, and improve sensor sensitivity.
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Power Semiconductor Probing
Power devices, built with wide bandgap technologies such as GaN and SiC, must be tested with very high voltages and/or currents.
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RF Tuning & Load-Pull
Full characterization and optimization of modern RF and mmW devices for 5G and other applications typically requires test at multiple operating frequencies and various source/load impedances, represented on a Smith chart.
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S-Parameter and DC Parametric
Device characterization requires a suite of measurements in the DC and frequency domains, with flexibility and easily integrated tools which work together seamlessly.
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Silicon Photonics Test
The emergence of silicon photonics has shifted photonic test and measurement to the wafer- and die-level, demanding efficient and highly-precise optical fiber positioning in 3D space.
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Terahertz Probing
THz technology applications include very high bandwidth communications, medical and security imaging, spectroscopy, pharmaceutical quality control, and more to come.
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Technical Papers
FormFactor leads the way in educating the industry on the latest on-wafer test and measurement techniques, through conference papers and presentations.
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Case Studies
Researchers rely on FormFactor wafer probe tools to explore next-generation technologies.
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Test Insights
FormFactor’s video series addresses today’s important test challenges.
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Documentation & Downloads
Hundreds of documents are available, to maximize productivity with FormFactor products – data sheets, application notes, articles, and more.
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