Cascade
Velox 3
Probe station control software
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Windows 10 compatible – User-centered design – Efficient and robust. Experience the new Velox™ 3 probe station control software!
Velox™ is FormFactor’s unique software suite for 200 mm and 300 mm wafer probe stations. It is the universal standard for semi- and fully-automated systems, enabling seamless communication between the user and more than 15 different platforms.
Velox reduces total cost of ownership by minimizing training efforts and providing faster time to robust and reliable data. As a key element of FormFactor’s exclusive Contact Intelligence™ technology for autonomous operation, it allows the user to perform measurement tasks faster, safer and more accurately. Velox enables safe and fast wafer loading, easy test automation and measurement system integration, while preventing costly damage of probes and probe cards throughout the entire measurement cycle.
Velox is installed on more than 2,100 FormFactor probe stations. Strong customer relationships and continuing advancements make Velox software the clear leader in probe station control.
New in Velox 3
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Velox Dash™ A Modern Touchscreen-Based Interface for Intuitive Probe Station Control FormFactor’s new companion device is here! Velox Dash™ enhances probe station control by providing access to the most used functionalities with just a touch of a finger. With its modern user interface, Velox Dash sets a standard for easy-to-use operation of engineering probe stations. The companion device combines an intuitive touch interface with an adaptable workplace. Additionally, Velox Dash consolidates the functionalities of hardware joystick and eVue remote control into a single platform. The novel Velox Dash’s user-centred design makes daily work a gratifying experience. |
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User-centered Design with New Icons and Skins For a modern look-and-feel we introduced a new color concept. All icons were thoroughly redesigned and are now better identifiable. Still, they are at the same place as before and instantly recognizable. Process- and safety-relevant information – such as the contact or the different stages in the Control Center – is clearly highlighted. Additionally, it is now easier to distinguish between application icons – such as Spectrum or SetupTool, and functional icons – such as AutoAlign or Light on/off. |
Floating Action Buttons
- Easy and fast setup of camera views
- Go to Light and Image Settings of the selected camera view with only one mouse click
Workflow Wizard
- Guided workflows for wafer setups, alignment tools and Autonomous Assistants
- Workflow wizard shows task-relevant settings and options only
- Wizard settings can be corrected anytime – no need to restart the wizard
- Wizard helps with intelligent solutions in case of error
Progress Bar
- Visualizes the progress of setup, alignment and measurement tasks
- Status information always at hand
Toast Notifications
- Informs the user about events, for example “Successful Alignment”
- Interacts with the user and helps with intelligent solutions
Motorized Positioner Manager
- For very complex wafer structures
- Enables automatic test of multiple devices in each die location before stepping to the next die
- Changes probe layouts automatically for each die
- Simple and easy to create and modify layouts
- No programming necessary
- Easy integration with test executive software
Augmented Align
- Improves RF, mmW and THz measurement accuracy and simplifies probe positioning
- Provides location markers on the screen that help the user know exactly where the probes will land, even if they cannot be seen due to being out of focus.
- Particularly helpful on THRU standards where the standard geometry makes it difficult to judge the offset from the edge of the pad.
- Interacts with WinCal: depending on their calibration substrate, users can either read FormFactor-predefined overlays or add a custom grouping of overlays.
Selective Die Soaking
- New level of wafer testing efficiency for non-ambient probing
- User can define soak times for each die
- Easy-to-use graphical interface
Selective Die Alignment
- User can define which dies need alignment
- No complex adaptations of the Test
- Executive necessary
Sub Die Handling
- Subdies can be labeled with different colors for better differentiation
- Drag/drop subdies to different positions in table
- Select multiple subdies in table
- Filter by labels
CONTACT INTELLIGENCE TECHNOLOGY
Non-Stop Autonomous Semiconductor Test
With FormFactor’s unique Contact Intelligence technology, Velox 3 enables 24/7 autonomous semiconductor test. Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to create a technology that provides benefits across a wide range of applications. This allows lengthy test routines to be performed overnight or the weekend without operator intervention – even over a wide temperature range. Contact Intelligence accelerates time to accurate data, time to market and ultimately – time to profitability.
SECS/GEM
Improving your Production Processes
SECS/GEM interfaces are a SEMI-standard industry-specific integration layer for semiconductor production. SECS/GEM interfaces establish the connection between the system and the higher level. Production and plant data, alarms, process values, process parameters etc. are transferred via SECS/GEM.
AUTOALIGN
Quickest Wafer Alignment and Mapping
Velox AutoAlign is the most ergonomic and quickest way to align a wafer in X, Y and theta and determine the wafer diameter and die size. It generates a wafer map corresponding to the evaluated die indices and number of recognized dies in both axes.
VUETRACK
VueTrack™ enables unattended testing over multiple temperatures for positioners or probe cards by automaticall aligning probes to pads, utilizing the eVue Pro microscope. VueTrack eliminates the need for manual re-adjustment and ensures constant contact quality.
REALIGN
Automatically Aligning Probe to Pads
ReAlign™ enables unattended testing over multiple temperatures for probe cards on the CM300xi probe station by automatically aligning probes to pads, utilizing three system-integrated cameras. It is recommended especially for applications with limited microscope view, such as vertical and Pyramid probe cards, or when using a test head.
CELLVIEW
CellView allows you to easily navigate and orientate on parts of the wafer that are out of view.
WORKFLOW GUIDE
Easy Step-by-Step Guidance
The Velox Workflow Guide enables unexperienced users to perform successful measurements by guiding the operator step-by-step through different processes, no matter if these are simple procedures or complex measurements.
VELOX SETUP TOOL
All Global Settings in One Place
The Velox Setup Tool combines all global Velox settings in one place – from autostart preferences, interface and device settings to license management. This simplifies the setup process, reduces training needs and safes time. Further Velox settings, such as for Control Center, WaferMap and Spectrum, will be successively integrated into the Setup Tool with the next Velox versions.
The all new Velox 3 probe station control software
Windows 10 compatible – User-centered design – Efficient and robust. Experience the new Velox 3 probe station control software for 200 mm and 300 mm semi- and fully automatic probe stations.
Spectrum Vision – Velox Wafer Probe Station Control Software
Spectrum Vision is part of FormFactor’s unique Velox wafer probe station control software. It acts as a powerful aid in wafer navigation, probe placement, wafer alignment, and sub-die navigation. It works seamlessly with the eVue™ multi-camera architecture and further system-integrated cameras to show a view of the needles from the top, the side and/or the bottom.
Velox™ AutoAlign
Velox AutoAlign is the most ergonomic and quickest way to align a wafer in theta and determine the wafer diameter and die size.
Velox™ VueTrack
VueTrack™ is an exclusive Velox feature that supports Contact Intelligence™ Technology. It enables unattended testing over multiple temperatures for positioners or probe cards by automatically aligning probes to pads. VueTrack eliminates the need for manual re-adjustment and ensures constant contact quality.
Velox™ ReAlign™
ReAlign is a powerful Velox feature that is supports Contact Intelligence Technology™. It enables unattended testing over multiple temperatures for probe cards on the CM300xi by automatically aligning probe to pads. It is recommended especially for applications with limited microscope view, such as vertical and Pyramid probe cards, or when using a test head.
Velox™ CellView
CellView is a powerful Velox feature that allows you to easily navigate and orientate on parts of the wafer that are out of view.
Velox™ Navigation Helper
The Velox Navigation Helper is a powerful feature which provides an easy overview of all stage positions
Velox™ Workflow Guide
The Velox Workflow Guide is a powerful feature which enables unexperienced users to perform successful measurements.
Autonomous RF Measurement Assistant
FormFactor’s Autonomous RF Measurement Assistant is the only solution in the market that enables true automatic, hands-free calibration and measurement of RF devices at multiple temperatures.
With our exclusive patented RF TopHat, motorized positioners and intelligent software algorithms, the solution runs over days without an operator – constantly monitoring calibration accuracy and ensuring measurement certainty for every device measurement. With more test data and higher accuracy, the Auto RF Measurement Assistant reduces cost of test, minimizes training needs and accelerates time to market.
The Autonomous RF Measurement Assistant is available for our 300 mm and 200 mm wafer probe stations CM300xi, SUMMIT200, Summit 12000 and Elite.
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